Pixelated energy resolving detectors enable acquisition of X-ray diffraction (XRD) signals using a hybrid energy- and angle- dispersive technique, potentially paving the way for the development of novel benchtop XRD imaging or computed tomography (XRDCT) systems, utilising readily available polychromatic X-ray sources. In this work, a commercially available pixelated cadmium telluride (CdTe) detector, HEXITEC (High Energy X-ray Imaging Technology), was used to demonstrate such an XRDCT system. Specifically, a novel fly-scan technique was developed and compared to the established step-scan technique, reducing the total scan time by 42% while improving the spatial resolution, material contrast and therefore the material classification.