Apparent increase in the thickness of superconducting particles at low temperatures measured by electron holography

Abstract

We predict that superconducting particles will show an apparent increase in thickness at low temperatures when measured by electron holography. This will result not from a real thickness increase, rather from an increase in the mean inner potential sensed by the electron wave traveling through the particle, originating in expansion of the electronic wavefunction of the superconducting electrons and resulting negative charge expulsion from the interior to the surface of the superconductor, giving rise to an increase in the phase shift of the electron wavefront going through the sample relative to the wavefront going through vacuum. The temperature dependence of the observed phase shifts will yield valuable new information on the physics of the superconducting state of metals.

Keywords: Electron holography; Interference micrograph; Superconductors; Thickness measurement.