X-ray focusing below 3 nm with aberration-corrected multilayer Laue lenses.
Dresselhaus JL, Zakharova M, Ivanov N, Fleckenstein H, Prasciolu M, Yefanov O, Li C, Zhang W, Middendorf P, Egorov D, De Gennaro Aquino I, Chapman HN, Bajt S.
Dresselhaus JL, et al. Among authors: zhang w.
Opt Express. 2024 Apr 22;32(9):16004-16015. doi: 10.1364/OE.518964.
Opt Express. 2024.
PMID: 38859238