Deploying Machine Learning Based Segmentation for Scientific Imaging Analysis at Synchrotron Facilities.
Hao G, Roberts EJ, Chavez T, Zhao Z, Holman EA, Yanxon H, Green A, Krishnan H, Ushizima D, McReynolds D, Schwarz N, Zwart PH, Hexemer A, Parkinson DY.
Hao G, et al. Among authors: krishnan h.
IS&T Int Symp Electron Imaging. 2023;35:IPAS-290. doi: 10.2352/ei.2023.35.9.ipas-290.
IS&T Int Symp Electron Imaging. 2023.
PMID: 38130938
Free PMC article.